16

Investigation of Au/Ti/Al ohmic contact to N-type 4H–SiC

Year:
2005
Language:
english
File:
PDF, 240 KB
english, 2005
19

A comparative study of sputtered TaCx and WCx films as diffusion barriers between Cu and Si

Year:
2001
Language:
english
File:
PDF, 1.09 MB
english, 2001